Image sensor chip sidewall interconnection

ABSTRACT

An image sensor chip having a sidewall interconnect structure to bond and/or electrically couple the image sensor chip to a package substrate is provided. The image sensor chip includes a substrate supporting an integrated circuit (IC) configured to sense incident light. The sidewall interconnect structure is arranged along a sidewall of the substrate and electrically coupled with the IC. A method for manufacturing the image sensor chip and an image sensor package including the image sensor chip are also provided.

BACKGROUND

Digital cameras and optical imaging devices employ image sensors. Imagesensors convert optical images to digital data that may be representedas digital images. An image sensor includes an array of pixel sensorsand supporting logic. The pixel sensors of the array are unit devicesfor measuring incident light, and the supporting logic facilitatesreadout of the measurements. Image sensors often manifest ascharge-coupled devices (CCDs), complementary metal oxide semiconductor(CMOS) devices, or back side illuminated (BSI) devices.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 illustrates a cross-sectional view of some embodiments of animage sensor package having an image sensor chip with a sidewallinterconnect structure.

FIG. 2 illustrates a cross-sectional view of some embodiments of animage sensor chip according to FIG. 1.

FIG. 3 illustrates a top view of some embodiments of an image sensorchip according to FIG. 1.

FIG. 4 illustrates a cross-sectional view of alternative embodiments ofan image sensor package having an image sensor chip with a sidewallinterconnect structure.

FIG. 5 illustrates a cross-sectional view of some embodiments of animage sensor chip according to FIG. 4.

FIG. 6 illustrates a top view of some embodiments of an image sensorchip according to FIG. 4.

FIG. 7 illustrates a flow chart of some embodiments of a method formanufacturing an image sensor package having an image sensor chip with asidewall interconnect structure.

FIG. 8 illustrates a flowchart of some embodiments of a method formanufacturing an image sensor chip having a sidewall interconnectstructure according to FIGS. 1-3.

FIG. 9 illustrates a flowchart of some embodiments of a method formanufacturing an image sensor chip having a sidewall interconnectstructure according to FIGS. 4-6.

FIGS. 10-28 illustrate a series of cross-sectional and top views of someembodiments of image sensor chip at various stages of manufacture, theimage sensor chip having a sidewall interconnect structure.

DETAILED DESCRIPTION

The present disclosure provides many different embodiments, or examples,for implementing different features of this disclosure. Specificexamples of components and arrangements are described below to simplifythe present disclosure. These are, of course, merely examples and arenot intended to be limiting. For example, the formation of a firstfeature over or on a second feature in the description that follows mayinclude embodiments in which the first and second features are formed indirect contact, and may also include embodiments in which additionalfeatures may be formed between the first and second features, such thatthe first and second features may not be in direct contact. In addition,the present disclosure may repeat reference numerals and/or letters inthe various examples. This repetition is for the purpose of simplicityand clarity and does not in itself dictate a relationship between thevarious embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Moreover, “first”, “second”, “third”, etc. may be used herein for easeof description to distinguish between different elements of a figure ora series of figures. “first”, “second”, “third”, etc. are not intendedto be descriptive of the corresponding element. Therefore, “a firstdielectric layer” described in connection with a first figure may notnecessarily corresponding to a “first dielectric layer” described inconnection with another figure.

Image sensors are typically manufactured in bulk on bulk substrates orwafers. The die to which the image sensors correspond are then separatedor singulated to form chips, which are typically packaged for use.Packaging provides protection against impact and corrosion, contacts toconnect image sensor chips to external devices, and heat dissipation.Packaging includes bonding an image sensor chip over a package substrateand electrically coupling the image sensor chip to the packagesubstrate. Further, a housing structure is formed over the image sensorchip to encapsulate the image sensor chip with the package substrate.The completed package can then bonded and/or electrically coupled to aflexible printed circuit (FPC) and/or to an external device.

According to some methods for packaging image sensor chips, an imagesensor chip is bonded over a ball grid array (BGA). The BGA includes apackage substrate and an array of solder balls arranged on an oppositeside of the package substrate as the image sensor chip. The image sensorchip is then electrically coupled to the array of solder balls throughthe package substrate by wire bonding the image sensor chip to thepackage substrate. Wire bonding packaging methods are cheap and easy toemploy. However, wire bonding packaging methods also introduce highresistance between the image sensor chip and the package substrate.This, in turn, reduces performance between the image sensor chip andexternal devices by increasing the resistance. Further, wire bondingpackaging methods result in a larger package size.

According to other methods for packaging image sensor chips, gold studsor bumps are formed over bond pads of an image sensor chip. The imagesensor chip is then flip chip/gold stud bonded (GSB) to a packagesubstrate through the gold studs or bumps. The bonding electricallycouples the image sensor chip, through the gold studs and the packagesubstrate, to an array of solder balls on a bottom of the packagesubstrate. Flip chip/GSB packaging methods yield smaller package size(relative to wire bonding) and lower resistance between the image sensorchip and the package substrate. The latter yields improved performancebetween the image sensor chip and external devices by reducing theresistance. However, flip chip/GSB packaging methods are also complex,require a special chip design, and have low yields.

According to yet other methods for packaging image sensor chips, animage sensor chip is formed with through silicon vias (TSVs) connectingto bond pads on a back side of the image sensor chip. Gold studs orbumps are then formed over the bond pads, and the image sensor is bondedto a BGA through the gold studs or bumps. The BGA includes a packagesubstrate and an array of solder balls arranged on an opposite side ofthe package substrate as image sensor chip. The bonding electricallycouples the image sensor chip, through the gold studs and the packagesubstrate, to the array of solder balls. TSV/GSB packaging methods yieldchip-scale packages and lower resistance connections between the imagesensor chip and external devices. However, TSV/GSB packaging methods arecostly, require a special chip design, and are limited to high-endhardware. Further, the height of the package is limited by the height ofthe solder balls.

In view of the foregoing, the present disclosure is directed to animproved method for packaging image sensor chips. The improved methodemploys a sidewall interconnection between an image sensor chip and apackage substrate to bond and/or electrically couple the image sensorchip to the package substrate. In contrast with known packaging methods,the package substrate can be an FPC or a component of an externaldevice. Hence, the packaging method of the present disclosure allows theimage sensor chip to be directly mounted to the FPC or a component ofthe external device. The present disclosure is also directed to animproved image sensor package resulting from performance of the improvedmethod. The improved image sensor package employs a sidewallinterconnect structure to bond and/or electrically couple the imagesensor chip to the package substrate.

The improved method and the improved package are compatible with backside illuminated (BSI) technology, and assembly of the image sensorpackage is advantageously simplified with a low entry level. Further,low resistance and high performance are advantageously achieved betweenthe image sensor chip and the FPC or external device, and a BGA or flipchip substrate is not needed. Even more, size and height areadvantageously reduced to, for example, chip-scale (i.e., no larger than1.2 times the size of the chip).

With reference to FIG. 1, a cross-sectional view 100 of an image sensorpackage according to some embodiments is provided. The image sensorpackage includes an image sensor chip 102 with conductive sidewallstructures 104 spaced around the periphery of the image sensor chip 102on the sidewalls of the image sensor chip 102. The conductive sidewallstructures 104 extend along the sidewalls for bonding and/orelectrically coupling the image sensor chip 102 to an external deviceand/or substrate. In some embodiments, the image sensor chip 102 is oneof a charge-coupled device (CCD), a complementary metal oxidesemiconductor (CMOS) device, or a BSI device.

A package substrate 106 having a larger footprint than the image sensorchip 102 is arranged below the image sensor chip 102. The footprint ofthe package substrate 106 is, for example, less than 1.2× the width and1.2× the length, of the image sensor chip 102, for a chip-scale package.In some embodiments, the package substrate 106 is a bulk semiconductorsubstrate or a silicon-on-insulator (SOI) substrate. In otherembodiments, the package substrate 106 is a BGA substrate, another chipor integrated circuit, or a FPC.

Package bond pads 108 are arranged below the image sensor chip 102 andover and/or within the package substrate 106. The package bond pads 108extend laterally perpendicular to the conductive sidewall structures 104and are electrically coupled through the package substrate 106 to anexternal device and/or external bond pads (not shown). For example, thepackage bond pads 108 are electrically coupled through the packagesubstrate 106 to solder balls (not shown) arranged on an opposite sideof the package substrate 106 as the image sensor chip 102. As anotherexample, the package bond pads 108 are electrically coupled through thepackage substrate 106 to an electronic circuit (not shown) arrangedwithin the package substrate 106.

Bonding and/or electrical coupling (B/EC) structures 110 are arrangedalong sidewalls of the image sensor chip 102 between correspondingpackage bond pads 108 and corresponding conductive sidewall structures104 to bond and/or electrically couple the image sensor chip 102 to thepackage substrate 106. There is typically a one-to-one correspondencebetween the B/EC structures 110 and the conductive sidewall structures104, and between the B/EC structures 110 and the package bond pads 108.Further, the B/EC structures 110 are typically solder balls, but othertypes of bonding structures are amenable.

The bonding and/or electrical coupling is advantageously performed atthe sidewalls of the image sensor chip 102 through the conductivesidewall structures 104. The image sensor chip 102 can directly abut thepackage substrate 106, and the image sensor chip 102 can directly abutthe package bond pads 108, without the B/EC structures 110 and/or anyother material intervening. Further, the size and the height of theimage sensor package can be reduced since intervening material is notneeded and the bonding and/or electrical coupling can be achieved withsmall margins between the sidewalls of the image sensor chip 102 and thepackage substrate 106. For example, the size and the height of the imagesensor package can be reduced to chip-scale (i.e., no larger than 1.2times the size of the chip). Even more, assembly of the image sensorpackage can be simplified since minimal changes are needed to the layoutof the image sensor chip. The bonding and/or electrical coupling iscompatible with BSI technology and achieves a low resistance, highperformance electrical connection between the image sensor chip 102 andthe package substrate 106.

A first housing structure 112 is arranged on the package substrate 106around the periphery of the image sensor chip 102. The first housingstructure 112 extends vertically above the image sensor chip 102 andlaterally inward over the image sensor chip 102, to define a firstaperture 114, typically circular in shape, over the image sensor chip102 between the sidewall of the lateral extension. In some embodiments,the sidewall of the lateral extension is lined with first screw threads116. A transparent plate 118, such as a glass plate, is bonded to abottom surface of the lateral extension by a first bonding structure 120and extends across the first aperture 114 over the image sensor chip102.

A second housing structure 122 is arranged, typically removablyarranged, in the first aperture 114. In some embodiments, the sidewallof the second housing structure 122 is lined with second screw threads124 configured to mate with the first screw threads 116. The secondhousing structure 122 includes a second aperture 126, typically circularin shape, over the image sensor chip 102. Within the second aperture126, one or more lenses 128 are arranged. The lenses 128 are designed tofocus light on to the image sensor chip 102 and secured to the secondhousing structure 122 by a second bonding structure 130.

In other embodiments, the image sensor chip 102 can be replaced withanother type of chip having a sidewall interconnect structure. Othertypes of chips include memory chips (e.g., flash memory chips), radiofrequency (RF) chips, and so on.

With reference to FIGS. 2 & 3, cross-sectional and top views 200, 300 ofan image sensor chip according to some embodiments are provided. FIG. 3is taken along line A-A′ of FIG. 2, and FIG. 2 is taken along line B-B′of FIG. 3. The image sensor chip is suitable for use as the image sensorchip 102 of FIG. 1. The image sensor chip includes an integrated circuit(IC) region 202 having an IC circuit for image sensing and an edgeregion 204 surrounding the IC region 202 for external connection to apackage substrate and/or external device. As described in greater detailhereafter, the edge region 204 employs sidewall interconnection to bondand/or electrically couple the IC region 202 to the package substrateand/or the external device. Typically, the image sensor chip is one of aCCD device, a CMOS device, or a BSI device.

A first substrate 206 supports an array 208 of pixel sensors, such asactive pixel sensors, and a supporting logic circuit 210 (collectivelythe IC circuit) within the IC region 202. The first substrate 206 is,for example, a bulk substrate of silicon, germanium, or group III andgroup V elements. Alternatively, the first substrate 206 is, forexample, a SOI substrate. The pixel sensors are unit devices for theconversion of an optical image into digital data and correspond to thesmallest areas to which light incident on the pixel sensor array 208 canbe localized therein. The supporting logic circuit 210 supports readoutof the pixel sensor array 208. Typically, the supporting logic circuit210 is arranged around the periphery of the pixel sensor array 208.

A device layer 212 and a back-end-of-line (BEOL) metallization stack 214are arranged over and/or with the first substrate 206 to collectivelyform the pixel sensor array 208 and the supporting logic circuit 210.The device layer 212 includes electronic devices, such as transistors,resistors, capacitors, photodiodes, etc., of the image sensor chip. Thedevice layer 212 typically includes photodetectors, such as photodiodes,for the pixel sensor array 208 and transistors for the supporting logiccircuit 210. The BEOL metallization stack 214 interconnects theelectronic devices by one or more metallization layers 216 arrangedwithin an interlayer dielectric (ILD) layer 218. One or more contacts220 electrically couple the device layer 212 to the metallization layers216, and one or more vias 222 electrically couple the metallizationlayers 216 to each other.

In some embodiments, as illustrated, the device layer 212 is arrangedover the BEOL metallization stack 214 on a bottom surface of and/orwithin a second substrate 224. In other embodiments, the secondsubstrate 224 is omitted and the device layer 212 is arranged below theBEOL metallization stack 214 on a top surface of and/or within the firstsubstrate 206. Typically, the second substrate 224 is employed where theimage sensor chip is a BSI device, such that the first substrate 206serves as a carrier substrate and the second substrate 224 serves as animage sensor substrate. The second substrate 224 is, for example, a bulksubstrate of silicon, germanium, or group III and group V elements.Alternatively, the second substrate 224 is, for example, a SOIsubstrate.

Image sensor bond pads 226, 228 are arranged within the ILD layer 218and the edge region 204 along sidewalls of the image sensor chip. Theimage sensor bond pads 226, 228 are electrically coupled to the ICregion 202 through the BEOL metallization stack 214. The image sensorbond pads 226, 228 include one or more external bond pads 226 toelectrically couple the device layer 212 to external devices for normaluse and one or more testing bond pads 228 for wafer acceptance testing(WAT) or circuit probing. Advantageously, the external bond pads 226 andthe testing bond pads 228 are separated. In some embodiments, asillustrated in FIG. 3, the image sensor bond pads 226, 228 have aconcave footprint laterally arcing into the image sensor chip.Advantageously, the concave footprint and the use of a sidewallinterconnection allows pitch between the image sensor bond pads 226, 228to be reduced since the sidewall surface area for bonding and electricalcoupling is increased. For example, the pitch P can be scaled down toabout 80 micrometers.

Conductive sidewall structures 104 are arranged around the periphery ofthe image sensor chip, abutting sidewalls of the image sensor bond pads226, 228, to define sidewalls of the image sensor chip. In someembodiments, the conductive sidewall structures 104 have a concavefootprint laterally arcing into the image sensor chip. The conductivesidewall structures 104 allow the image sensor chip to be bonded with apackage substrate at the sidewalls of the image sensor chip. Further,the conductive sidewall structures 104 electrically couple with the ICregion 202 through the BEOL metallization stack 214 to allow the imagesensor chip to be electrically coupled with a package substrate at thesidewalls of the image sensor chip. Advantageously, such electricalcoupling allows a low resistance, high performance connection betweenthe image sensor chip and external devices connected to the image sensorchip through the package substrate. Further, such bonding and/orelectrical coupling advantageously allow easy packaging and a reducedprofile and footprint.

An inner seal ring (not shown) and an outer seal ring (not shown) arearranged in the edge region around the IC region. The inner seal ring isarranged within the outer seal ring along the periphery of the ICregion, and the outer seal ring is arranged along sidewalls of the imagesensor chip. The inner and outer seal rings serve to protect the ICregion from contaminants (e.g., sodium) from mechanical stress inducedby a die saw or other processes employed to separate multiple die formedon a semiconductor wafer into individual die. The inner and out sealrings can take on any thickness. However, in some embodiments, the innerseal ring and/or the outer seal ring are 10 micrometers thick.

A color filter array 234 is arranged over the pixel sensor array 208 anda micro lens array 236 is arranged over the color filter array 234. Thecolor filter array 234 is a mosaic of tiny color filters placed toassign colors to the pixel sensors, because pixel sensors are unable todistinguish between light of different colors. For example, the colorfilter array 234 is a Bayer filter. A Bayer filter includes a mosaic ofred, green and blue filters arranged in a filter pattern of 50% green,25% red, and 25% blue. Such an arrangement of filters is advantageousbecause red, green, and blue can be mixed in different combinations toproduce most of the colors visible to the human eye. The micro lensarray 236 focuses light through a color filter array 234 to the pixelsensor array 208.

A flatness layer 238 is arranged between the color filter array 234 andthe micro lens array 236. Further, in some embodiments, the flatnesslayer 238 is arranged over a top surface of the second substrate 224and/or the BEOL metallization stack 214. The flatness layer 238 smoothsthe top surface of the color filter array 234 to reduce surfaceroughness of the color filter array 234 and to reduce topographicaldifferences between micro lenses of the micro lens array 236. Theflatness layer 238 is transparent and includes, for example, siliconoxide or aluminum oxide.

With reference to FIG. 4, a cross-sectional view 400 of an image sensorpackage according to alternative embodiments is provided. The imagesensor package includes an image sensor chip 402 with a transparentplate 404, such as a glass plate, arranged along the top of the imagesensor chip 402 to define a cavity 406 within the image sensor chip 402.The cavity is suitably arranged over a sensing region of the imagesensor chip 402. In some embodiments, the image sensor chip 402 is oneof a CCD, a CMOS device, or a BSI device.

A conductive layer 408 of the image sensor chip 402 is arranged along abottom of the image sensor chip 402. The conductive layer 408 lines TSVholes 410 in the bottom of the image sensor chip 402 and lateralrecesses 412 in the sidewalls of the image sensor chip 402. Regions ofthe conductive layer 408 lining the TSV holes 410 define TSVs 414, andregions of the conductive layer 408 lining the lateral recesses 412define conductive sidewall structures 416. The conductive sidewallstructures 416 are spaced around the periphery of the image sensor chip402 on the sidewalls of the image sensor chip 402 to bond the imagesensor chip 402 to an external device and/or substrate, and/or toelectrically couple the image sensor chip 402 to the external deviceand/or substrate through corresponding TSVs 414. Typically, there is aone-to-one correspondence between the conductive sidewall structures 416and the vias 414.

A package substrate 106 having a larger footprint than the image sensorchip 402 is arranged below the image sensor chip 402, and package bondpads 108 are arranged below the image sensor chip 402 over and/or withinthe package substrate 106. The footprint of the package substrate 106is, for example, less than 1.2× the width and 1.2× the length, of theimage sensor chip 402, for a chip-scale package. The package bond pads108 extend laterally perpendicular to the conductive sidewall structures416 and are electrically coupled through the package substrate 106 to anexternal device and/or external bond pads (not shown).

Bonding and/or electrical coupling (B/EC) structures 418 are arrangedalong sidewalls of the image sensor chip 402 between correspondingpackage bond pads 108 and corresponding conductive sidewall structures416 to bond and/or electrically couple the image sensor chip 402 to thepackage substrate 106. There is typically a one-to-one correspondencebetween the B/EC structures 418 and the conductive sidewall structures104, and between the B/EC structures 418 and the package bond pads 108.Further, the B/EC structures 418 are typically solder balls, but othertypes of bonding structures are amenable.

The bonding and/or electrical coupling is advantageously performed atthe sidewalls of the image sensor chip 402 through the conductivesidewall structures 416. The image sensor chip 402 can directly abut thepackage substrate 106, and the image sensor chip 402 can directly abutthe package bond pads 108, without the B/EC structures 418 and/or anyother material intervening. Further, the size and the height of theimage sensor package can be reduced. Even more, assembly of the imagesensor package can be simplified. The bonding and/or electrical couplingis compatible with BSI technology and achieves a low resistance, highperformance electrical connection between the image sensor chip 402 andthe package substrate 106.

A first housing structure 112 is arranged on the package substrate 106around the periphery of the image sensor chip 402. The first housingstructure 112 extends vertically above the image sensor chip 402 andlaterally inward over the image sensor chip 402, to define a firstaperture 114, typically circular in shape, over the image sensor chip102 between the sidewall of the lateral extension. In some embodiments,the sidewall of the lateral extension is lined with first screw threads116.

A second housing structure 122 is arranged, typically removablyarranged, in the first aperture 114. In some embodiments, the sidewallof the second housing structure 122 is lined with second screw threads124 configured to mate with the first screw threads 116. The secondhousing structure 122 includes a second aperture 126, typically circularin shape, over the image sensor chip 402. Within the second aperture126, one or more lenses 128 are arranged. The lenses 128 are designed tofocus light on to the image sensor chip 402 and secured to the secondhousing structure 122 by a bonding structure 130.

With reference to FIGS. 5 & 6, cross-sectional and top views 500, 600 ofan image sensor chip according to some embodiments are provided. FIG. 6is taken along line C-C′ of FIG. 5, and FIG. 5 is taken along line D-D′of FIG. 6. The image sensor chip is suitable for use as the image sensorchip 402 of FIG. 4. The image sensor chip includes an IC region 502having an IC circuit for image sensing and an edge region 504surrounding the IC region 502 for external connection to a packagesubstrate and/or external device. As described in greater detailhereafter, the edge region 504 employs sidewall interconnection to bondand/or electrically couple the IC region 502 to the package substrateand/or the external device. Typically, the image sensor chip is one of aCCD, a CMOS device, or a BSI device.

A first substrate 506 supports an array 508 of pixel sensors and asupporting logic circuit 510 (collectively the IC circuit) within the ICregion 502. The first substrate 506 is, for example, a bulksemiconductor substrate of silicon, germanium, or group III and group Velements. Alternatively, the first substrate 506 is, for example, a SOIsubstrate. The pixel sensors are unit devices for the conversion of anoptical image into digital data and correspond to the smallest areas towhich light incident on the pixel sensor array 508 can be localizedtherein. The supporting logic circuit 510 supports readout of the pixelsensor array 508. Typically, the supporting logic circuit 510 isarranged around the periphery of the pixel sensor array 508.

A device layer 512 and a BEOL metallization stack 514 are arranged overand/or within the first substrate 506 to collectively form the pixelsensor array 508 and the supporting logic circuit 510. The device layer512 includes electronic devices, such as transistors, resistors,capacitors, photodiodes, etc., of the image sensor chip. The BEOLmetallization stack 514 interconnects the electronic devices by one ormore metallization layers 516 arranged within an ILD layer 518. One ormore contacts 520 electrically couple the device layer 512 to themetallization layers 516, and one or more vias 522 electrically couplethe metallization layers 516 to each other.

In some embodiments, as illustrated, the device layer 512 is arrangedover the BEOL metallization stack 514 on a bottom surface of and/orwithin a second substrate 524. In other embodiments, the secondsubstrate 524 is omitted and the device layer 512 is arranged below theBEOL metallization stack 514 on a top surface of and/or within the firstsubstrate 506. The second substrate 524 is, for example, a bulksemiconductor substrate of silicon, germanium, or group III and group Velements. Alternatively, the second substrate 524 is, for example, a SOIsubstrate.

Image sensor bond pads 526, 528 are arranged within the ILD layer 518and the edge region 504 along sidewalls of the image sensor chip. Theimage sensor bond pads 526, 528 are electrically coupled to the ICregion 502 through the BEOL metallization stack 514. The image sensorbond pads 526, 528 include one or more external bond pads 526 toelectrically couple the device layer 512 to external devices for normaluse and one or more testing bond pads 528 for WAT or circuit probing.

TSV holes 410 extend through the first substrate 506 to the image sensorbond pads 526, 528, and lateral recesses 412 extend laterally into thesidewall of the first substrate 506 adjacent to corresponding TSV holes410. The lateral recesses 412 are such that the bottoms of the lateralrecesses 412 are open and the ILD layer 518 overhangs the lateralrecesses 412. In some embodiments, the TSV holes 410 and the lateralrecesses 412 extend partially into the ILD layer 518 and/or there is aone-to-one correspondence between the TSV holes 410 and the lateralrecesses 412. A dielectric layer 530 arranged below the first substrate506 lines the sidewalls of the TSV holes 410 and of the lateral recesses412, and a conductive layer 408 arranged below the dielectric layer 530lines the TSV holes 410 and the lateral recesses 412.

Regions of the conductive layer 408 lining the TSV holes 410 define TSVs414, and regions of the conductive layer 408 lining the lateral recesses412 define conductive sidewall structures 416. The TSVs 414 electricallycouple the conductive sidewall structures 416 to the image sensor bondpads 526, 528 through the first substrate 506. The conductive sidewallstructures 416 allow the image sensor chip to be bonded with a packagesubstrate at the sidewalls of the image sensor chip. Further, theconductive sidewall structures 416 allow the image sensor chip to beelectrically coupled with a package substrate at the sidewalls of theimage sensor chip through the BEOL metallization stack 514 and the TSVs414. Advantageously, such electrical coupling allows a low resistance,high performance connection between the image sensor chip and externaldevices connected to the image sensor chip through the packagesubstrate. Further, such bonding and/or electrical couplingadvantageously allow easy packaging and a reduced profile and footprint.

An inner seal ring (not shown) and an outer seal ring (not shown) arearranged in the edge region around the IC region. The inner seal ring isarranged within the outer seal ring along the periphery of the ICregion, and the outer seal ring is arranged along sidewalls of the imagesensor chip. The inner and outer seal rings serve to protect the ICregion from contaminants (e.g., sodium) from mechanical stress inducedby a die saw or other processes employed to separate multiple die formedon a semiconductor wafer into individual die. The inner and out sealrings can take on any thickness. However, in some embodiments, the innerseal ring and/or the outer seal ring are 10 micrometers thick.

A color filter array 536 is arranged over the pixel sensor array 508 anda micro lens array 538 is arranged over the color filter array 536. Thecolor filter array 536 is a mosaic of tiny color filters placed toassign colors to the pixel sensors, because pixel sensors are unable todistinguish between light of different colors. For example, the colorfilter array 536 is a Bayer filter. The micro lens array 538 focuseslight through a color filter array 536 to the pixel sensor array 508.

A flatness layer 540 is arranged between the color filter array 536 andthe micro lens array 538. Further, in some embodiments, the flatnesslayer 540 is arranged over a top surface of the second substrate 524and/or the BEOL metallization stack 514. The flatness layer 540 smoothsthe top surface of the color filter array 536 to reduce surfaceroughness of the color filter array 536 and to reduce topographicaldifferences between micro lenses of the micro lens array 538. Theflatness layer 540 is transparent and includes, for example, siliconoxide or aluminum oxide.

An epoxy layer 542 is arranged over the flatness layer 540 around thecolor filter and micro lens arrays 536, 538, and a dam layer 544 isarranged over the epoxy layer 542 around the color filter and micro lensarrays 536, 538. The epoxy layer 542 provides a bond between the damlayer 544 and the flatness layer 540, and the dam layer 544 providesspacing between the micro lens array 538 and a transparent plate 404,such as a glass plate, arranged over the micro lens array 538 and thedam layer 544. The transparent plate 404 forms a cavity 406 over themicro lens array 538 between the transparent plate 404, the epoxy layer542, the dam layer 544, and the flatness layer 540.

With reference to FIG. 7, a flowchart 700 provides some embodiments of amethod for manufacturing an image sensor package having an image sensorchip with a sidewall interconnect structure. Examples of the imagesensor package are shown in FIGS. 1 and 4.

At 702, an image sensor die having a first bond pad region is provided.The first bond pad region extends laterally over a substrate of theimage sensor die.

At 704, an image sensor chip including the image sensor die and asidewall interconnect structure is formed. The sidewall interconnectstructure is arranged along a sidewall of the image sensor die and inelectrical communication with the first bond pad region.

At 706, a package substrate having a second bond pad region is provided.

At 708, the image sensor chip is bonded and/or electrically coupled tothe second bond pad region at the sidewall of the image sensor chipthrough the sidewall interconnect structure.

At 710, a housing structure is formed over the package substrate aroundthe image sensor chip to encapsulate the image sensor chip between thepackage substrate and the housing structure.

Advantageously, by bonding and/or electrically coupling the image sensorchip to the package substrate at the sidewall of the image sensor chip,a low resistance, high performance electrical connection can be formedbetween the package substrate and the image sensor chip. Further, thesize of the package housing can be reduced since bonding and/orelectrical coupling can be achieved with a small margin between thesidewall of the package substrate and the image sensor chip, and withouta substrate or other material arranged between top and bottom surfacesof the image sensor chip and the package substrate. Moreover, thesidewall interconnect structure can be integrated into the image sensorchip with minimal modifications to the layout of the image sensor chip.

With reference to FIG. 8, a flowchart 800 of some embodiments of amethod for manufacturing an image sensor chip having a sidewallinterconnect structure. Examples of the image sensor chip are shown inFIGS. 1-3. In some embodiments, the method is employed to carry outAction 704 of FIG. 7.

At 802, a first image sensor die and a second image sensor die areprovided. The first and second image sensor die respectively have afirst bond pad region and a second bond pad region extending laterallyover a substrate.

At 804, an opening is formed in the substrate between the first andsecond image sensor die to expose sidewalls of the first and second bondpad regions.

At 806, color filter arrays are formed or otherwise arranged oversensing regions of the first and second image sensor die.

At 808, a flatness layer is formed over the color filter arrays andlining the opening.

At 810, micro lens arrays are formed or otherwise arranged over thecolor filter arrays.

At 812, regions of the flatness layer lining sidewalls of the openingare removed.

At 814, a conductive layer is formed lining the sidewalls of the openingand in electrical communication with the sidewalls of first and secondbond pad regions.

At 816, the thickness of the wafer is reduced to expose the openingopposite the color filter and micro lens arrays.

At 818, the first and second image sensor die are separated to form afirst image sensor chip and a second image sensor chip respectivelyincluding the first and second image sensor die and sidewallinterconnect structures along sidewalls of the first and second imagesensor die.

With reference to FIG. 9, a flowchart 900 of some embodiments of amethod for manufacturing an image sensor chip having a sidewallinterconnect structure. Examples of the image sensor chip are shown inFIGS. 4-6. In some embodiments, the method is employed to carry out 704of FIG. 7.

At 902, a first image sensor die and a second image sensor die areprovided. The first and second image sensor die respectively have afirst bond pad region and a second bond pad region extending laterallyover a substrate.

At 904, color filter arrays are formed or otherwise arranged oversensing regions of the first and second image die.

At 906, a flatness layer is formed over the color filter arrays and thefirst and second image sensor die.

At 908, micro lenses are formed or otherwise arranged over the colorfilter arrays.

At 910, an epoxy layer and a dam layer are stacked over the flatnesslayer between the micro lens arrays.

At 912, a glass plate is provided and bonded to the substrate throughthe dam layer.

At 914, the thickness of the substrate is reduced opposite the colorfilter and micro lens arrays.

At 916, TSV holes are formed through the substrate to the first andsecond bond pad regions and through the substrate between the first andsecond bond pad regions.

At 918, a dielectric layer lining sidewalls of the TSV holes, but notlining the first and second bond pad regions, is formed.

At 920, a conductive layer lining the sidewalls of the TSV holes and inelectrical communication with the first and second bond pad regions isformed.

At 922, the first and second image sensor die are separated along thesacrificial hole to form a first image sensor chip and a second imagesensor chip respectively including the first and second image sensor dieand sidewall interconnect structures along sidewalls of the first andsecond image sensor die.

While the disclosed methods (e.g., the method described by theflowcharts 700, 800, 900) are illustrated and described herein as aseries of acts or events, it will be appreciated that the illustratedordering of such acts or events are not to be interpreted in a limitingsense. For example, some acts may occur in different orders and/orconcurrently with other acts or events apart from those illustratedand/or described herein. Further, not all illustrated acts may berequired to implement one or more aspects or embodiments of thedescription herein, and one or more of the acts depicted herein may becarried out in one or more separate acts and/or phases.

With reference to FIGS. 10-18, cross-sectional views of some embodimentsof an image sensor chip at various stages of manufacture are provided toillustrate the method of FIG. 8. Although FIGS. 10-18 are described inrelation to the method, it will be appreciated that the structuresdisclosed in FIGS. 10-18 are not limited to the method, but instead maystand alone as structures independent of the method. Similarly, althoughthe method is described in relation to FIGS. 10-18, it will beappreciated that the method is not limited to the structures disclosedin FIGS. 10-18, but instead may stand alone independent of thestructures disclosed in FIGS. 10-18.

FIG. 10 illustrates a cross-sectional view 1000 of some embodimentscorresponding to Action 802.

As shown by FIG. 10, a semiconductor structure having a first imagesensor die 1002 and a second image sensor die 1004 is provided. Thefirst and second image sensor die 1002, 1004 correspond tonon-overlapping regions of the semiconductor structure, and are spacedwith a scribe line 1006 arranged between the first and second imagesensor die 1002, 1004. The first and second image sensor die 1002, 1004include corresponding ICs 1008, 1010 for sensing and/or measuring lightincident on the first and second image sensor die 1002, 1004. The ICs1008, 1010 correspond to, for example, CCD devices, CMOS devices, or BSIdevices.

Arranged over and/or within a first substrate 1012, a device layer 1014and a BEOL metallization stack 1016 collectively form the ICs 1008,1010. The first substrate 1012 is, for example, a bulk semiconductorsubstrate of silicon, germanium, or group III and group V elements.Alternatively, the first substrate 1012 is, for example, a SOIsubstrate. The device layer 1014 includes electronic devices, such astransistors, resistors, capacitors, photodiodes, etc. The BEOLmetallization stack 1016 interconnects the electronic devices by one ormore metallization layers 1018 arranged within an interlayer ILD layer1020. One or more contacts 1022 electrically couple the device layer1014 to the metallization layers 1018, and one or more vias 1024electrically couple the metallization layers 1018 to each other.

In some embodiments, the device layer 1014 is arranged over the BEOLmetallization stack 1016 on a bottom surface of and/or within a secondsubstrate 1026. In other embodiments, the second substrate 1026 isomitted and the device layer 1014 is arranged below the BEOLmetallization stack 1016 on a top surface of and/or within the firstsubstrate 1012. The second substrate 1026 is, for example, a bulksemiconductor substrate of silicon, germanium, or group III and group Velements. Alternatively, the second substrate 1026 is, for example, aSOI substrate.

Image sensor bond pads 1028 are arranged within the ILD layer 1020between the first and second image sensor die 1002, 1004. The imagesensor bond pads 1028 are electrically coupled to the device layer 1014through the BEOL metallization stack 1016 to facilitate externalconnection of the first and second image sensor die 1002, 1004 toexternal devices. The first and second image sensor die 1002, 1004include corresponding, non-overlapping regions of the image sensor bondspads 1028 separated by the scribe line 1006.

FIGS. 11 and 12 illustrate cross-sectional and top views 1100, 1200 ofsome embodiments corresponding to Action 804. FIG. 12 is taken alongline E-E′ of FIG. 11, and FIG. 11 is taken along line F-F′ of FIG. 12.

As shown by FIGS. 11 and 12, a first etch is performed through selectregions of the second substrate 1026, the BEOL metallization stack 1016,the ILD layer 1020, and the image sensor bond pad regions, and intoselect regions of the first substrate 1012, to form an opening 1102between the first and second image sensor die 1002, 1004. In someembodiments, as illustrated in FIG. 12, the first etch also formsconcave recesses 1202, 1204 laterally arcing into the image sensor bondpad regions of the remaining first and second image sensor die 1002′,1004′. The process for the first etch includes, for example, forming afirst photoresist layer over a top surface of the second substrate 1026or the BEOL metallization stack 1016, patterning the first photoresistlayer, applying an etchant to the second substrate 1026 or the BEOLmetallization stack 1016 to selectively etch areas of the secondsubstrate 1026 or the BEOL metallization stack 1016 that are not maskedby the patterned first photoresist layer 1104, and removing thepatterned first photoresist layer 1104.

FIG. 13 illustrates a cross-sectional view 1300 of some embodimentscorresponding to Actions 806, 808, and 810.

As shown by FIG. 13, color filter arrays 1302 corresponding to theremaining first and second image sensor die 1002′, 1004′ are formed orotherwise arranged over sensing regions of the corresponding remainingimage sensor die 1002′, 1004′. In some embodiments, the color filterarrays 1302 are formed or otherwise arranged on the remaining secondsubstrate 1026′. In other embodiments, the color filter arrays 1302 areformed or otherwise arranged on the remaining BEOL metallization stack1016′ or the remaining ILD layer 1020′. The color filter arrays 1302are, for example, Bayer filters.

Also shown by FIG. 13, a flatness layer 1304 is formed over the colorfilter arrays 1302 and lining the opening 1102. By lining the opening1102, sidewalls of the remaining image sensor bond pads 1028′, theremaining first and second substrate 1012′, 1026′, the remaining BEOLmetallization stack 1016′, and the remaining ILD layer 1020′ are lined.The flatness layer 1304 is transparent and smooths the top surfaces ofthe color filter arrays 1302 to reduce surface roughness of the colorfilter arrays 1302. In some embodiments, the flatness layer 1304 is orotherwise includes, for example, silicon oxide or aluminum oxide, andmay be deposited by way of a physical vapor deposition technique (e.g.,CVD, PE-CVD, PVD, etc.).

Also shown by FIG. 13, micro lens arrays 1306 corresponding to theremaining first and second image sensor die 1002′, 1004′ are formed orotherwise arranged over the color filter arrays 1302 and the flatnesslayer 1304. The micro lens arrays 1306 focus light through the flatnesslayer 1304 and the color filter arrays 1302 to the device layer 1014 forsensing by the ICs 1008, 1010.

FIG. 14 illustrates a cross-sectional view 1400 of some embodimentscorresponding to Action 812.

As shown by FIG. 14, a second etch is performed through selectionregions of the flatness layer 1304 to remove regions of the flatnesslayer 1304 lining sidewalls of the opening 1102. The second etch can beperformed by any suitable etching technique, including dry etching andlaser etching. In some embodiments, the process for the second etchincludes forming a second photoresist layer over a top surface of theflatness layer 1304, patterning the second photoresist layer, applyingan etchant to the flatness layer 1304 in areas not masked by thepatterned second photoresist layer 1402, and removing the patternedsecond photoresist layer 1402.

FIGS. 15 and 16 illustrate cross-sectional views 1500, 1600 of someembodiments corresponding to Action 814.

As shown by FIG. 15, a conductive layer 1502 is formed over theremaining flatness layer 1304′ and lining the opening 1102. By liningthe opening 1102, the conductive layer 1502 abuts the exposed sidewallsof the remaining image sensor bond pads 1028′. In some embodiments, theconductive layer 1502 has concave recesses laterally arcing into theimage sensor bond pad regions of the remaining first and second imagesensor die 1002′, 1004′. The conductive layer 1502 is or otherwiseincludes, for example, copper, aluminum, tungsten, or aluminum copper.

As shown by FIG. 16, a third etch is performed through select regions ofthe conductive layer 1502 surrounding the opening 1102 to remove theseregions. In some embodiments, the process for the third etch includesforming a third photoresist layer over a top surface of the conductivelayer 1502, patterning the third photoresist layer, applying an etchantto the conductive layer 1502 in areas not masked by the patterned thirdphotoresist layer 1602, and removing the patterned third photoresistlayer 1602.

FIG. 17 illustrates a cross-sectional view 1700 of some embodimentscorresponding to Action 816.

As shown by FIG. 17, tape 1702 is formed or otherwise arranged over themicro lens arrays 1306, the remaining flatness and conductive layers1304′, 1502′, and the opening 1102. Further, with the tape 1702 formedor otherwise arranged, a planarization is performed into the remainingfirst substrate 1012′ to reduce the thickness of the remaining firstsubstrate 1012′ and to expose the opening 1102. In some embodiments, theplanarization is also performed into regions of the remaining conductivelayer 1502′ lining the opening 1102. The planarization can, for example,be performed using a chemical-mechanical planarization or polishing(CMP).

FIG. 18 illustrates a cross-sectional view 1800 of some embodimentscorresponding to Action 818.

As shown by FIG. 18, the remaining first and second image sensor die1002″, 1004″ are separated. In some embodiments, the separation isperformed by moving a die saw along the scribe line 1006 into the tape1702 and/or through the tape 1702 and the semiconductor structure. Theseparation forms first and second image sensor chips 1802, 1804correspondingly including the remaining first and second image sensordie 1002″, 1004″ and sidewall interconnect structures 1806 along thesidewalls of the remaining first and second image sensor die 1002″,1004″. The sidewalls interconnect structures 1806 are formed from theremaining conductive layer 1502″ and provide an external structure forbonding and/or electrically coupling the first and second image sensorchips 1802, 1804 to an external device.

Subsequent to the separation, the remaining tape 1702′ can be removedand the first and second image sensor chips 1802, 1804 can be packaged.For example, the first and second image sensor chips 1802, 1804 can besoldered and/or GSBed to a package substrate and/or to an externaldevice.

With reference to FIGS. 19-28, cross-sectional views of some embodimentsof an image sensor chip at various stages of manufacture are provided toillustrate the method of FIG. 9. Although FIGS. 19-28 are described inrelation to the method, it will be appreciated that the structuresdisclosed in FIGS. 19-28 are not limited to the method, but instead maystand alone as structures independent of the method. Similarly, althoughthe method is described in relation to FIGS. 19-28, it will beappreciated that the method is not limited to the structures disclosedin FIGS. 19-28, but instead may stand alone independent of thestructures disclosed in FIGS. 19-28.

FIG. 19 illustrates a cross-sectional view 1900 of some embodimentscorresponding to Actions 902, 904, 906 and 908.

As shown by FIG. 19, a semiconductor structure having a first imagesensor die 1902 and a second image sensor die 1904 is provided. Thefirst and second image sensor die 1902, 1904 correspond tonon-overlapping regions of the semiconductor structure, and are spacedwith a scribe line 1906 arranged between the first and second imagesensor die 1902, 1904. The first and second image sensor die 1902, 1904include corresponding ICs 1908, 1910 for sensing and/or measuring lightincident on the first and second image sensor die 1902, 1904. The ICs1908, 1910 correspond to, for example, CCD devices, CMOS devices, or BSIdevices.

Arranged over and/or within a first substrate 1912, a device layer 1914and a BEOL metallization stack 1916 collectively form the ICs 1908,1910. The first substrate 1912 is, for example, a bulk semiconductorsubstrate of silicon, germanium, or group III and group V elements.Alternatively, the first substrate 1912 is, for example, a SOIsubstrate. The device layer 1914 includes electronic devices, such astransistors, resistors, capacitors, photodiodes, etc. The BEOLmetallization stack 1916 interconnects the electronic devices by one ormore metallization layers 1918 arranged within an interlayer ILD layer1920. One or more contacts 1922 electrically couple the device layer1914 to the metallization layers 1918, and one or more vias 1924electrically couple the metallization layers 1918 to each other.

In some embodiments, the device layer 1914 is arranged over the BEOLmetallization stack 1916 on a bottom surface of and/or within a secondsubstrate 1926. In other embodiments, the second substrate 1926 isomitted and the device layer 1914 is arranged below the BEOLmetallization stack 1916 on a top surface of and/or within the firstsubstrate 1912. The second substrate 1926 is, for example, a bulksemiconductor substrate of silicon, germanium, or group III and group Velements. Alternatively, the second substrate 1926 is, for example, aSOI substrate.

Image sensor bond pads 1928 are arranged within the ILD layer 1920 alongthe periphery of the first and second image sensor die 1902, 1904. Theimage sensor bond pads 1928 are electrically coupled to the device layer1914 through the BEOL metallization stack 1916 to facilitate externalconnection of the first and second image sensor die 1902, 1904 toexternal devices.

Also shown by FIG. 19, color filter arrays 1930 corresponding to thefirst and second image sensor die 1902, 1904 are formed or otherwisearranged over sensing regions of the corresponding image sensor die1902, 1904. In some embodiments, the color filter arrays 1930 are formedor otherwise arranged on the second substrate 1926. In otherembodiments, the color filter arrays 1930 are formed or otherwisearranged on the BEOL metallization stack 1916 or the ILD layer 1920. Thecolor filter arrays 1930 are, for example, Bayer filters.

Also shown by FIG. 19, a flatness layer 1932 is formed over the colorfilter arrays 1930. In some embodiments, the flatness layer 1932 is alsoformed over the second substrate 1926 and/or the BEOL metallizationstack 1916. The flatness layer 1932 is transparent and smooths the topsurfaces of the color filter arrays 1930 to reduce surface roughness ofthe color filter arrays 1930. The flatness layer 1932 is or otherwiseincludes, for example, silicon oxide or aluminum oxide.

Also shown by FIG. 19, micro lens arrays 1934 corresponding to the firstand second image sensor die 1902, 1904 are formed or otherwise arrangedover the color filter arrays 1930 and the flatness layer 1932. The microlens arrays 1934 focus light through the flatness layer 1932 and thecolor filter arrays 1930 to the device layer 1914 for sensing by the ICs1908, 1910.

FIG. 20 illustrates a cross-sectional view 2000 of some embodimentscorresponding to Actions 910 and 912.

As shown by FIG. 20, an epoxy layer 2002 and a dam layer 2004 arestacked in that order between the micro lens arrays 1934 over one ormore of the flatness layer 1932, the second substrate 1926 and the BEOLmetallization stack 1916. The epoxy layer 2002 bonds the dam layer 2004to the first substrate 1912 through, for example, the flatness layer1932, the second substrate 1926 or the BEOL metallization stack 1916.The dam layer 2004 provides a platform arranged above the micro lensarrays 1934.

Also shown by FIG. 20, a transparent plate 2006, such as a glass plate,is provided and bonded over the dam layer 2004 on the platform. The damlayer 2004 provides spacing between the transparent plate 2006 and themicro lens arrays 1934 to allow the transparent plate 2006 to cover themicro lens arrays 1934.

FIG. 21 illustrates a cross-sectional view 2100 of some embodimentscorresponding to Action 914.

As shown by FIG. 21, tape 2102 is formed or otherwise arranged over thetransparent plate 2006. Further, with the tape 2102 formed or otherwisearranged, a planarization is performed on the first substrate 1912 toreduce the thickness of the first substrate 1912. The planarization can,for example, be performed using a CMP.

FIGS. 22 and 23 illustrate cross-sectional and top views 2200, 2300 ofsome embodiments corresponding to Action 916. FIG. 23 is taken alongline G-G′ of FIG. 22, and FIG. 22 is taken along line H-H′ of FIG. 22.

As shown by FIGS. 22 and 23, a first etch is performed through selectregions of the remaining first substrate 1912′ into the remaining firstand second image sensor die 1902′, 1904′. The first etch forms TSV holes2202 extending through the remaining first substrate 1912′ to the imagesensor bond pads 1928. Further, the first etch forms a sacrificial hole2204 extending through the remaining first substrate 1912′ between theTSV holes 2202 and overlapping with the scribe line 1906. In someembodiments, the first etch is also performed into the BEOLmetallization stack 1916 and the ILD layer 1920. The process for thefirst etch can include forming a first photoresist layer below a bottomsurface of the remaining first substrate 1912′, patterning the firstphotoresist layer, applying an etchant to the remaining first substrate1912′ in areas not masked by the patterned first photoresist layer 2206,and removing the patterned first photoresist layer 2206.

FIGS. 24 and 25 illustrate cross-sectional views 2400, 2500 of someembodiments corresponding to Action 918.

As shown by FIG. 24, a dielectric layer 2402 is formed below theremaining first and second image sensor die 1902″, 1904″ and below theremaining first substrate 1912′. The dielectric layer 2402 lines the TSVand sacrificial holes 2202, 2204, including regions of the remainingBEOL metallization stack 1916′ and the remaining ILD layer 1920′ withinthe TSV and sacrificial holes 2202, 2204. The dielectric layer 2402 isor otherwise includes, for example, silicon dioxide, silicon nitride, orsilicon oxynitride.

As shown by FIG. 25, a second etch is performed through select regionsof the dielectric layer 2402 to remove regions of the dielectric layer2402 covering the image sensor bond pads 1928 in the TSV holes 2202. Insome embodiments, the second etch further removes regions of thedielectric layer 2402 covering the remaining ILD layer 1920′ and/or theremaining BEOL metallization stack 1916′ in the sacrificial hole 2204.Further, in some embodiments, the second etch further removes regions ofthe dielectric layer 2402 surrounding the TSV and sacrificial holes2202, 2204. The process for the second etch can include forming a secondphotoresist layer below a bottom surface of the dielectric layer 2402,patterning the second photoresist layer, applying an etchant to thedielectric layer 2402 in areas not masked by the patterned secondphotoresist layer 2502, and removing the patterned second photoresistlayer 2502.

FIGS. 26 and 27 illustrate cross-sectional views 2600, 2700 of someembodiments corresponding to Action 920.

As shown by FIG. 26, a conductive layer 2602 is formed below theremaining dielectric layer 2402′ and lining the TSV and sacrificialholes 2202, 2204. Further, the conductive layer 2602 extendscontinuously between the TSV holes 2202 and the sacrificial holes 2204.By lining the TSV and sacrificial holes 2202, 2204, the conductive layer2602 abuts the exposed surfaces of the image sensor bond pads 1928 andelectrically couples regions of the conductive layer 2602 within thesacrificial holes 2204 to the image sensor bond pads 1928. Theconductive layer 2602 is or otherwise includes, for example, copper,aluminum, tungsten, or aluminum copper.

As shown by FIG. 27, a third etch is performed through select regions ofthe conductive layer 2602 to remove regions of the conductive layer 2602surrounding the TSV and sacrificial holes 2202, 2204, while leavingregions of the conductive layer 2602 extending between TSV holes 2202and the sacrificial hole 2204. In some embodiments, the process for thethird etch includes forming a third photoresist layer below a bottomsurface of the conductive layer 2602, patterning the third photoresistlayer, applying an etchant the conductive layer 2602 in areas not maskedby the patterned third photoresist layer 2702, and removing thepatterned third photoresist layer 2702.

FIG. 28 illustrates a cross-sectional view 2800 of some embodimentscorresponding to Action 922.

As shown by FIG. 28, the remaining first and second image sensor die1902″, 1904″ are separated. In some embodiments, the separation isperformed by moving a die saw along the scribe line 1906 into and/orthrough the tape 2102, and through the transparent plate 2006, the damlayer 2004, the epoxy layer 2002, the flatness layer 1932, the secondsubstrate 1926, the remaining BEOL metallization stack 1916′, theremaining ILD layer 1920′, and the remaining conductive layer 2602′.

The separation forms first and second image sensor chips 2802, 2804correspondingly including the remaining first and second image sensordie 1902″, 1904″ and sidewall interconnect structures 2806. For example,the remaining first and second image sensor die 1902″, 1904″ and thesidewall interconnect structures 2806 include corresponding regions ofthe remaining transparent plate 2006′, the remaining dam layer 2004′,the remaining epoxy layer 2002′, the remaining flatness layer 1932′, theremaining second substrate 1926′, the remaining BEOL metallization stack1916″, the remaining ILD layer 1920″, and the remaining conductive layer2602″. The sidewall interconnect structures 2806 are arranged along thesidewalls of the remaining first and second die 1902″, 1904″ andelectrically coupled to corresponding TSVs 2808. The sidewallsinterconnect structures 2806 and the TSVs 2808 are formed from theremaining conductive layer 2602″ and provide an external structure forbonding and/or electrically coupling the first and second image sensorchips 2802, 2804 to an external device.

Subsequent to the separation, the remaining tape 2102′ can be removed,and the first and second image sensor chips 2802, 2804 can be packaged.For example, the first and second image sensor chips 2802, 2804 can besoldered and/or GSBed to a package substrate and/or to an externaldevice.

Thus, as can be appreciated from above, the present disclosure providesan image sensor chip. A substrate supports an integrated circuit ICconfigured to sense incident light. A sidewall interconnect structure isarranged along a sidewall of the substrate and electrically coupled withthe IC.

In other embodiments, the present disclosure provides a method formanufacturing an image sensor chip. An image sensor die is providedhaving a substrate supporting an IC for sensing incident light. Asidewall interconnect structure is formed along a sidewall of thesubstrate and in electrical communication with the IC.

In yet other embodiments, the present disclosure provides an imagesensor package. A package substrate has a package bond pad. An imagesensor chip is arranged over the package substrate. The image sensorchip includes an IC electrically coupled with a sidewall interconnectstructure arranged along a sidewall of the image sensor chip. Anelectrical coupling structure is arranged over the package bond padalong the sidewall of the image sensor chip. The electrical couplingstructure is configured to electrically couple the IC to the packagebond pad through the sidewall interconnect structure.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

1. An image sensor chip comprising: a substrate supporting an integratedcircuit (IC) configured to sense incident light; and a sidewallinterconnect structure arranged along a sidewall of the substrate andelectrically coupled with the IC.
 2. The image sensor chip according toclaim 1, further including: a through silicon via (TSV) extendingthrough the substrate to the IC and configured to electrically couplethe sidewall interconnect structure to the IC.
 3. The image sensor chipaccording to claim 2, further including: a conductive layer arrangedbelow the substrate and configured to electrically connect the TSV andthe sidewall interconnect structure. 4-6. (canceled)
 7. The image sensorchip according to claim 1, further including: a back-end-of-line (BEOL)metallization stack arranged over the substrate; and a device layerarranged over the substrate and electrically coupled to the sidewallinterconnect structure through the BEOL metallization stack.
 8. Theimage sensor chip according to claim 7, further including: a secondsubstrate arranged over the BEOL metallization stack, wherein the devicelayer is arranged between the second substrate and the BEOLmetallization stack. 9-19. (canceled)
 20. An image sensor packagecomprising: a package substrate having a package bond pad; an imagesensor chip arranged over the package substrate, the image sensor chipincluding an integrated circuit (IC) electrically coupled with asidewall interconnect structure arranged along a sidewall of the imagesensor chip; and an electrical coupling structure arranged over thepackage bond pad along the sidewall of the image sensor chip andconfigured to electrically couple the IC to the package bond pad throughthe sidewall interconnect structure.
 21. The image sensor chip accordingto claim 2, further comprising: a back-end-of-line (BEOL) metallizationstack arranged over the substrate and comprising an image sensor bondpad, wherein the image sensor bond pad is arranged within an interlayerdielectric (ILD) layer of the BEOL metallization stack; and an openingextending through the substrate, into the ILD layer, to expose the imagesensor bond pad, wherein the TSV is arranged in the opening.
 22. Theimage sensor chip according to claim 21, wherein the TSV comprises: adielectric layer lining sidewalls of the opening; and a conductive layerlining the opening and contacting the image sensor bond pad, wherein theconductive layer is insulated from the substrate by the dielectriclayer.
 23. The image sensor chip according to claim 21, wherein aportion of the opening is unfilled.
 24. The image sensor chip accordingto claim 21, further comprising: a recess extending laterally into asidewall of the substrate; and a conductive layer continuously liningthe opening and the recess, wherein the conductive layer contacts theimage sensor bond pad.
 25. The image sensor chip according to claim 8,further comprising: a transparent plate arranged over and bonded to thesecond substrate through an epoxy layer.
 26. The image sensor packageaccording to claim 20, wherein a lower surface of the image sensor chipdirectly contacts an upper surface of the package bond pad.
 27. Theimage sensor package according to claim 20, further comprising: ahousing structure supporting an optical lens over the image sensor chip,wherein the optical lens is configured to focus incident light on theimage sensor chip.
 28. The image sensor package according to claim 20,wherein the image sensor chip comprises: a substrate supporting the IC,wherein the IC is configured to sense incident light; and a throughsilicon via (TSV) extending through the substrate to the IC andconfigured to electrically couple the sidewall interconnect structure tothe IC.
 29. The image sensor package according to claim 28, wherein theimage sensor chip further comprises: a conductive layer arranged belowthe substrate and configured to electrically couple the TSV and thesidewall interconnect structure.
 30. The image sensor package accordingto claim 28, wherein the image sensor chip comprises: a back-end-of-line(BEOL) metallization stack arranged over the substrate and comprising animage sensor bond pad, wherein the image sensor bond pad is arrangedwithin an interlayer dielectric (ILD) layer of the BEOL metallizationstack; and an opening extending through the substrate, into the ILDlayer, to expose the image sensor bond pad, wherein the TSV is arrangedin the opening.
 31. The image sensor package according to claim 30,wherein the image sensor chip comprises: a recess extending laterallyinto a sidewall of the substrate; and a conductive layer lining theopening and the recess, wherein the conductive layer contacts the imagesensor bond pad, and wherein the conductive layer extends continuouslyfrom the opening to the recess.
 32. The image sensor package accordingto claim 20, wherein the image sensor chip comprises: a substratesupporting the IC, wherein the IC is configured to sense incident light;a back-end-of-line (BEOL) metallization stack arranged over thesubstrate; and a second substrate arranged over the BEOL metallizationstack; and a device layer arranged over the BEOL metallization stack,between the second substrate and the BEOL metallization stack, whereinthe device layer is electrically coupled to the sidewall interconnectstructure through the BEOL metallization stack.
 33. The image sensorpackage according to claim 20, further comprising: a transparent platearranged over and bonded to the image sensor chip through an epoxylayer.
 34. An image sensor chip, comprising: a back-end-of-line (BEOL)metallization stack arranged over a first substrate, wherein an imagesensor bond pad is arranged within an interlayer dielectric (ILD) layerof the BEOL metallization stack; a second substrate arranged over theBEOL metallization stack; a device layer arranged over the BEOLmetallization stack, between the second substrate and the BEOLmetallization stack, wherein the device layer comprises a pixel sensorregion configured to sense incident radiation; an opening extendingthrough the first substrate, into the ILD layer, to expose the imagesensor bond pad, wherein the opening is adjacent to a sidewall of thefirst substrate; and a conductive layer lining the opening and thesidewall, wherein the conductive layer contacts the image sensor bondpad, and wherein the conductive layer extends continuously from theopening to the sidewall.